X. Zhou, "Physics-Based Compact Variability/Reliability
Modeling for Emerging Double-Gate/Nanowire MOSFETs," (Invited Talk),
the
9th International Conference on ASIC (ASICON2011),
Xiamen, China, Oct. 28, 2011.
X. Zhou, S. H. Lin, and M. K. Srikanth, "Statistical
Compact Modeling for Emerging Nanowire / FinFET Mismatch and Variance Studies,"
(Invited Paper), Proc. of the 6th
International Conference on Materials for Advanced Technologies (ICMAT2011),
Symposium
W: Reliability and Variability of Emerging Devices for Future Technologies
and ULSI Circuits and Systems, Singapore, June 2011, Paper
W6-2.
Z. H. Chen, X. Zhou, M. K. Srikanth, G. J. Zhu, and
S. H. Lin, "Unified Compact Modeling of Drain-Source Current for Bulk MOSFETs
with Interface Traps," Proc. of the 6th
International Conference on Materials for Advanced Technologies (ICMAT2011),
Symposium
W: Reliability and Variability of Emerging Devices for Future Technologies
and ULSI Circuits and Systems, Singapore, June 2011, Poster
W-PO1-7.
X. Zhou, G. J. Zhu, S. H. Lin, Z. H. Chen, M. K.
Srikanth, Y. F. Yan, R. Selvakumar, W. Chandra, J. B. Zhang, C. Q. Wei,
Z. H. Wang, and P. Bathla, "Subcircuit Approach to Inventive Compact Modeling
for CMOS Variability and Reliability," Proc.
of the 12th International Symposium on Integrated Circuits, Devices &
Systems (ISIC2009),
Singapore, Dec. 2009, pp. 133-138.
X. Zhou, G. J. Zhu, S. H. Lin, C. Q. Wei, J. B. Zhang,
Z. H. Chen, M. K. Srikanth, R. Selvakumar, and Y. F. Yan, "Unification
of MOSFET Compact Models with the Unified Regional Modeling Approach,"
(Invited Talk), MOS-AK
Workshop, Baltimore, MD, Dec. 9, 2009.
X. Zhou, G. J. Zhu, G. H. See, J. B. Zhang, S. H.
Lin, C. Q. Wei, Z. H. Chen, M. K. Srikanth, Y. F. Yan, R. Selvakumar, and
W. Chandra, "Unified Compact Modeling for Bulk/SOI/FinFET/SiNW MOSFETs,"
(Invited
Paper), Proc. of the 2nd International
Workshop on Electron Devices and Semiconductor Technology (IEDST2009),
Mumbai, India, Jun. 2009, Paper
I8.
X.-F. Wang, L.-N. Zhao, Z.-H. Yao, Z.-F. Hou, M.
Yee, X. Zhou, S.-H. Lin, and T.-S. Lee, "Ab Initio Study of Gating Effect
on a Nanoscale Si/SiO2 Field-Effect Transistor," oral presentation
at the 2008 Asian Conference on Nanoscience
and Nanotechnology (AsiaNANO2008),
Singapore, Nov. 3-7, 2008.
G. J. Zhu, G. H. See, S. H. Lin, C. Q. Wei, J. B.
Zhang, Z. H. Chen, R. Selvakumar, and X. Zhou, "Xsim: Unification of MOSFET
Compact Models with the Unified Regional Modeling Approach," poster presentation
at the
MOS-AK/ESSDERC/ESSCIRC Workshop, Edinburgh,
UK, Sep. 19, 2008.
X. Zhou, G. H. See, Z. M. Zhu, S. H. Lin, C. Q. Wei,
G. J. Zhu, G. H. Lim, "Unified Compact Modeling of Emerging Multiple-Gate
MOSFETs," (Invited Paper), Proc.
of the 2007 International Workshop on Electron Devices and Semiconductor
Technology (IEDST2007),
Beijing, China, Jun. 4, 2007, pp.
31-36.
W. Z. Shangguan, X. Zhou, S. B. Chiah,
G. H. See, K. Chandrasekaran, "A
Transfer-matrix Based Compact Gate Tunneling Current Model," the
3rd International Conference on Materials for Advanced Technologies (ICMAT-2005),
Symposium L: Materials Physics at Interfaces, Singapore, Jul. 3-8, 2005,
Paper L-8-OR21.
X. Zhou, S. B. Chiah, K. Chandrasekaran,
G. H. See, W. Z. Shangguan, S. M. Pandey,
C. H. Ang, M. Cheng, and S. Chu, L.-C. Hsia,
"Unified Regional Charge Model with Non-pinned Surface Potential," (Invited
Paper), Proc. of the 2nd International
Workshop on Compact Modeling (IWCM-2005) at the Asia and South Pacific
Design Automation Conference (ASP-DAC2005),
Shanghai, Jan. 20, 2005, pp. 13-17.
Y. Wang, K. Y. Lim, W. Qian, and X. Zhou, "Investigation
of Reverse Short Channel Effect with Numerical and Compact Models,"
in Design, Modeling, and Simulation in Microelectronics, Bernard
Courtois, Serge N. Demidenko, L. Y. Lau, Editors,
Proc. of SPIE, Vol. 4228, pp. 366-373, 2000. Presented
at the 2nd International Symposium on Microelectronics
and Assembly (ISMA2000),
Singapore, Nov. 27 - Dec. 1, 2000.
T. Tang, X. Zhou, and C. C. Jong, "Mixed-Mode
Simulation of High-Speed HFET Logic Circuit," Proc.
of the 6th International Symposium on IC Technology, Systems & Applications
(ISIC-95), Singapore, Sep. 6-8, 1995, pp. 510-514.
H. J. Lee, M. S. Tse, K. Radhakrishnan, K. Prasad, J. Weng, S. F. Yoon,
X. Zhou, and H. S. Tan, "Selective Wet Etching of GaAs/AlGaAs Heterostructure
with Citric Acid/Hydrogen Peroxide Solutions for Pseudomorphic GaAs/AlGaAs/InGaAs
HFETs Fabrication," J. Materials Sci. Eng. B:
Solid-State Materials for Advanced Technology, Vol. 35, pp.
230-233, December 1995; Proc. of the 1st
International Conference on Low Dimensional Structures & Devices (LDSD
95), Singapore, May 8-10, 1995.
H. J. Lee, M. S. Tse, K. Radhakrishnan, K. Prasad, S. F. Yoon, J. Weng,
X. Zhou, H. S. Tan, S. K. Ting, and Y. C. Leong, "Characterization of Ni/Ge/Au/Ni/Au
Contact Metallization on AlGaAs/InGaAs Heterostructures for Pseudomorphic
HFET Application," J. Materials Sci. Eng. B: Solid-State
Materials for Advanced Technology, Vol. 35, pp. 234-238, December
1995; Proc. of the 1st International Conference
on Low Dimensional Structures & Devices (LDSD 95), Singapore,
May 8-10, 1995.
H. J. Lee, M. S. Tse, J. Weng, K. Prasad, K. Radhakrishnan, S. F. Yoon,
X. Zhou, H. S. Tan, S. K. Ting, and Y. C. Leong, "Fabrication and Characterization
of Pseudomorphic AlGaAs/InGaAs Heterostructure Field Effect Transistors
(HFETs)," Proc. of the 1st International Conference
on Low Dimensional Structures & Devices (LDSD 95), Singapore,
May 8-10, 1995.
M. S. Tse, H. J. Lee, K. Prasad, K. Radhakrishnan, J. Weng, S. F. Yoon,
X. Zhou, and H. S. Tan, "Characterization of Au/(Ge,Si)/Pd (Si,Ge) Ohmic
Contact Metallization on AlGaAs/InGaAs Heterostructures for Pseudomorphic
HFET Applications," Proc. of the 1st International
Conference on Low Dimensional Structures & Devices (LDSD 95),
Singapore, May 8-10, 1995.