Xsim: A Compact Model for Bridging Technology Developers
and Circuit Designers
Xing Zhou
School of Electrical & Electronic Engineering, Nanyang Technological
University
Nanyang Avenue, Singapore 639798, exzhou@ntu.edu.sg
Proc. of the 5th International Conference on
Modeling and Simulation of Microsystems (WCM-MSM2002)
San Juan, Puerto Rico, April 22-25, 2002, pp.
710-714.
Copyright | Abstract
| References | Citation | Reprint
|
Slides
|
Back
Copyright Notice
© 2002 Computational Publications. Personal use of this material
is permitted. However, permission to reprint/republish this material for
advertising or promotional purposes or for creating new collective works
for resale or redistribution to servers or lists, or to reuse any copyrighted
component of this work in other works must be obtained from Computational
Publications.
Abstract
This paper describes the ideas and philosophy behind a new compact model
(CM) for deep-submicron MOSFETs, called Xsim, which has been developed
from scratch over the past few years. Similarities to and differences
from existing popular models are pointed out. The opinions on many
controversial debates in the CM field are given. The ultimate goal
of the CM development in the context of technology/circuit modeling and
optimization is outlined.
References
-
[1] Y. P. Tsividis and K. Suyama, IEEE J. Solid-State Circuits, vol. 29,
pp. 210–216, 1994.
-
[2] See complete information at the website:
www.ntu.edu.sg/home/exzhou/research/DOUST/pub.htm
-
[3] X. Zhou, S. B. Chiah, K. Y. Lim, Y. Wang, X. Yu, S. Chwa, A. See, and
L. Chan, Proc. ICSICT-2001, Shanghai, 2001, pp. 855–860.
-
[4] D. Foty, MOSFET Modeling with SPICE, Principles and Practice, Prentice
Hall, 1997.
-
[5] K. Y. Lim and X. Zhou, “MOSFET subthreshold compact modeling with effective
gate overdrive,” IEEE Trans. Electron Devices, vol. 49, 2002.
-
[6] X. Zhou, S. B. Chiah, and K. Y. Lim, “A compact deep-submicron MOSFET
gds model including hot-electron and thermoelectric effects,” Proc. ISDRS-01,
Washington DC, 2001.
-
[7] X. Zhou, K. Y. Lim, and D. Lim IEEE Trans. Electron Devices, vol. 46,
pp. 807–809, 1999.
-
[8] S. S. Rofail, K.-S.Yeo, and K.-W. Chew, IEE Proc. - Circuits, Devices
and Systems, vol. 146, pp. 83–89, 1999.
Citation
-
[2] X. Zhou, "Multi-Level
Modeling of Deep-Submicron MOSFETs and ULSI Circuits," (Invited Paper),
Proc. of the 9th International Conference on Mixed Design of Integrated
Circuits and Systems (MIXDES2002), Wroclaw, Poland, June 2002, pp. 39-44.
-
[8] X. Zhou,
S. B. Chiah, and K. Y. Lim, "A Technology-Based Compact Model for Predictive
Deep-Submicron MOSFET Modeling and Characterization," (Invited Paper),
Proc. of the 6th International Conference on Modeling and Simulation of
Microsystems (WCM-MSM2003), San Francisco, CA, Feb. 2003, vol. 2, pp. 266-269.