An Experimentally-Based DC Model for the Bi-MOS Structure
and Its Adaptation to a Circuit Simulation Environment
S. S. Rofail, K. S. Yeo, K. W. Chew, X. Zhou, and T. Tang†
School of Electrical & Electronic Engineering, Nanyang Technological
University, Nanyang Avenue, Singapore 639798
† Department of Electrical Engineering, University of Rochester,
Rochester, NY 14627, U.S.A.
Proc. of the IEEE Canadian Conference on Electrical
and Computer Engineering (CCECE98)
Waterloo, Canada, May 24-28, 1998, Vol. 1, pp. 37-40.
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Abstract
This paper presents an experimentally-based model that can accurately
describe the hybrid-mode operation of deep submicron LDD pMOSFETs in a
circuit environment. Unified equations for the MOS, bipolar, and
space charge currents of the Bi-MOS structure were derived and later adapted
to meet the circuit simulation requirements.
References
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[1] S. Verdonckt-Vandebroek, S. S. Wong, J. C. S. Woo, and P. K. Ko, "High-gain
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[2] K. S. Yeo and S. S. Rofail, "A full-swing high speed CBiCMOS digital
circuit for low-voltage applications," IEE Proc. Circuits, Devices and
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[3] S. S. Rofail and K. S. Yeo, "Experimentally based analytical model
of deep-submicron LDD pMOSFETs in a bi-MOS hybrid-mode environment," IEEE
Trans. Electron Devices, Vol. 44, No. 9, pp. 1473-1482, 1997.
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[4] T. Grotjohn and B. Hoefflinger, "A parametric short-channel MOS transistor
model for subthreshold and strong inversion current," IEEE Trans. Electron
Devices, Vol. ED-31, No. 2, pp. 234-246, 1984.
Citation
S. S. Rofail, K.-S. Yeo, K.-W. Chew, "DC model for BiMOS structure
and its adaptation to a circuit simulation environment," IEE Proc. - Circuits,
Devices Syst., Vol. 146, No. 2, pp. 83-89, Apr. 1999.
IEL Citation