subject:activities of the vlsi technology and circuits committee, Jan 2001 to Dec 2001
date:December 8, 2001.
(attached to existing conferences or start new ones)
2. Special Issues for major publications (e.g. T-ED)
3. Panel session topics for major conferences
4. Special Sessions for major conferences
During this year, much effort was spent on organizing an Emerging Technology Session and Evening Panel Discussion within the IEDM. A list of topics for new special issues was proposed. Furthermore, a workshop on compact modeling was initiated. The membership in the committee was put onto a broader basis to account better for the special needs of EDS members worldwide. Details will be described in a later section.
This committee continues to operate entirely by
email.
During the meeting on December
5, 2001 the committee decided to limit the membership to two years, once
renewable. In
this way the total membership term is limited to a maximum of 4 years.
This rule applies also to the chairman. The reason for the change is that
it better fits the two-years term of the Adcom than the previous three-years
term. It applies to all members whose term does not expire at the end of
2001.
The reason for limitation of the membership term is to make sure that new ideas can be incorporated. Atsushi Hori and Werner Weber will step down at the end of the year since their terms expire. Savvas Chamberlain, Tsu-Jae King, and Pierre Woerlee step down due to other engagement. All other committee members from 2000 were invited to serve for another year. In addition new members should be appointed to replace those who resigned. Jim Hutchby has been appointed the new chairman.
The present members are
listed below:
|
|
|
Werner
Weber
Infineon (Chair, stepping down)
Atsushi
Hori,
Matsushita (stepping down)
|
Lalita
Manchanda,
Agere
Ken-ichi
Goto,
Fujitsu
Savvas
Chamberlain,
DALSA (stepping down) S.C.
Sun,
ProMos Willy
Sansen,
K.U. Leuven Pierre
Woerlee,
Philips, (stepping down) Tsu-Jae
King,
UC Berkeley, (stepping down) Xing
Zhou,
Nanyang Technological University |
Mark
Law,
U. Florida
Jeff
Welser,
IBM Technology Group
Ilesanmi
Adesida,
U. Illinois Jim
Hutchby,
SRC Akira
Toriumi,
U Tokyo Kwyro
Lee,
KAIST |
Background
of the Emerging Technology session on "Interconnecting Devices":
The
session is entitled "Interconnecting Devices," and consists entirely of
invited talks from experts in the field.This
year's chosen subject is of critical importance today, due to the increasing
need for very high bandwidth operation by high-speed computing, networking,
and internet applications.The talks
cover a broad range of emerging technologies, including optical and wireless
interconnects and novel three-dimensional chip and wiring structures, all
aimed to address the challenges ofhigh-speed
communication both across a chip and between chips.In
addition to giving the IEDM attendees a good overview of future technologies,
the session also serves as a launching pad for a lively debate on the topic
in the evening panel session to which it is linked: "Interconnecting Devices
for the Terabit Era."
Speakers/Topics:
James
Meindl(Georgia
Tech) Future Interconnect/Architecture
Challenges
Frank
Chang (UCLA)Wireless
Interconnects
Eric
Beyne(IMEC)Thin-film
Multilayer Wiring / 3D Stack Chips
Sadik
Esener(UCSD)Optical
Interconnects
Sam
Purushothaman(IBM)K<2
Dielectrics
The Emerging Technology evening panel session at IEDM is entitled “Interconnecting Devices for the Terabit Era: Myths, Rumors, and Heresies, Panel Moderator – Jim Hutchby, SRC
Panel Topic:
Much has been said and written about the looming (arguably, current) problem of global interconnect (intra- and inter-chip), particularly related to intra-chip global clock/signal distribution.Views range from having to replace current Cu/Low-k global interconnect technology with an alternate solution by the 65-nm node in 2007 – to the notion that this “incrementally worsening” problem can be managed via new systems architectures and Cu/Low-k global interconnect modifications. Eventually, however, accelerating clock frequencies (10’s of GHz) will drive Cu/Low-k global interconnects to their limit performance.Alternate solutions for global interconnect include optical and RF interconnects (guided wave and free space) and a variety of heterogeneous and monolithic 3D integration approaches.Regarding optical approaches, many diverse views abound.Some speculate that optical interconnect will be used for local or semi-global intra-chip interconnects, while others are skeptical about application of optical approaches even for inter-chip interconnects within multi-chip packages.Others propose new RF communications technologies (CDMA and FDMA) for global interconnect while others are exploiting new markets for heterogeneous 3D integration of mixed functions and technologies.In this “interconnect soup” of controversial problem definition and myriad technological approaches, the following questions are addressed:
¨Is the “Global Interconnect Problem” a “Red Brick Wall” show stopper, or is it a soft limit that eventually will require an alternate solutions?
¨What are the issues defining the limits of Cu/Low-k from systems and microprocessor points of view?
¨Is optical interconnect a viable technology approach for inter-chip applications.Will it ever be applicable to intra-chip applications?Will the power dissipation be a limiting factor?
¨Will RF interconnect provide sufficient number of channels within an achievable bandwidth to be useful?Again, will the power dissipation in RF interconnects be a limiting factor?
¨Will 3D integration have significant impact on the global interconnect issue, or will it be more opportunity driven to integrate dissimilar functions and materials?Again, what about the power dissipation and thermal management issues?
Sadik EsenerUCSD (Optical)
Bob MarkunasZiptronix (3D Integration)
Jim MeindlGeorgia Institute of Technology (Interconnect Systems Issues)
Shinichi OgawaSELETE (Cu/Low-k Technologies)
Ian YoungIntel (Microprocessor Architectural Approaches)
Tom TheisIBM (Interconnect Systems Issues)
Furthermore, there is an ongoing discussion about a Special Issue on Interconnects for T-ED. This special issue was fermented by a proposal from the VLSI Technology and Circuits Committee in 2000.
·Physics-based I-V model formulations
·Scalable AC/RF/noise models
·Predictive models with process correlation
·Statistical modeling with compact models
·Compact model with higher-order (atomic level) effects
·Parameter extraction
·Global vs local optimization
·Equivalent circuit generation from numerical simulation
·Compact solution from surface-potential-based models
·Benchmark tests and model comparisons
·Role of CM in bridging technology development, TCAD, and circuit design
·Trend and needs in compact models in the VDSM era
·Accounting
for ultra-deep submicron aspects in a design oriented MOSFET model
Matthias Bucher, National Tech. Univ. Greece
·Recent
development of the BSIM4 model
Mansun Chan, Hong Kong Univ. of Science and Tech., Hong Kong
·RF
MOS noise parameter extraction and modeling
Jamal Deen, Mc Master Univ., Canada
·TCAD
and ECAD: Is there a connection
Michael Duane, Applied Materials, USA
·Recent
Advances in the EPFL-EKVMOS transistor compact model
Christian Enz, Swiss Center for Electronics and Microtechnology,
Switzerland
·A
unified process-based compact model for scaled PD/SOI and bulk-Si MOSFETs
Jerry Fossum, Univ. Florida, USA
·Gm/Id-based
modeling and analog design
Daniel Foty, Gilgamesh Associates, USA
·Advanced
surface-potential-based model (SP)
Gennady Gildenblat, PennState Univ., USA
·Experimental
determination of the electron and hole low field mobility in FD/SOI in
the single or double gate operation
Marco Mastrapasqua, Agere Systems, USA
·How
to build an SOI MOSFET compact model without violating the laws of physics
Josef Watts, IBM, USA
·Xsim:
A compact model for bridging technology develpopers and circuit designers
Xing Zhou, Nanyang Technological Univ., Singapore
Panelists:
·Peter
Bendix, LSI Logic, USA
·Mansun
Chan, Hong Kong University of Science and Technology, Hong Kong
·Christian
Enz, Swiss Center for Electronics and Microtechnology, Switzerland
·Daniel
Foty, Gilgamesh Associates, USA
·Gennady
Gildenblat, Pennsylvania State University, USA
·Mitiko
Miura-Mattausch, Hiroshima University, Japan
·MOS
transistor RF modeling for RF IC design
Christian Enz, Swiss Center for Electronics and Microtechnology,
Switzerland
·Implications
of modeling (good or bad) on circuit design
Daniel Foty, Gilgamesh Associates, USA
·Automatic
generation of compact RF models directly from device simulation
Serge Luryi, State Universtiy of New York at Stony Brook, USA
Andrea Pacelli, State Universtiy of New York at Stony Brook, USA
·MOSFET
model HiSIM
Mitiko Miura-Mattausch, Hiroshima University, Japan