This project is directed towards the design of a framework for aiding nanometer technology development and transistor optimization.  With the support of technology computer-aided design (TCAD) tools, technology data and transistor characteristics will be generated from design of experiments (DOE) to form the database.  The designed framework will be able to access this database for optimizing transistor performance through process variations.  This idea will be extended to successive technology generations to explore the application of the framework in aiding new technology development.  Combined with a compact model (CM) for predicting and optimizing new technologies, it will demonstrate the ultimate application of the designed framework in linking technology development with device/circuit performance optimization.

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