About IEEE | IEEE Memberships | Products and Services | Conferences | IEEE Organizations | News | Home  
IEEE Xplore   Search Results
  HelpFAQTerms
Welcome to IEEE Xplore
Home
Log-out
Tables of Contents
Journals and Magazines
Conference Proceedings
Standards
Search
By Author
Basic Search
Advanced Search
Member Services
Join the IEEE
IEEE Member Services
Your search matched 14 of 740919 documents.
Results are shown 25 to a page, sorted by publication year in descending order.
You may refine your search by editing the current search expression or entering a new one the text box.
Then click Search Again.
Results:
Journal or Magazine = JNL   Conference = CNF   Standard = STD

1 MOSFET subthreshold compact modeling with effective gate overdrive
Khee Yong Lim; Xing Zhou
Electron Devices, IEEE Transactions on , Volume: 49 Issue: 1 , Jan 2002
Page(s): 196 -199

[Abstract]   [PDF Full-Text]   JNL


2 Unified MOSFET compact I-V model formulation through physics-based effective transformation
Xing Zhou; Khee Yong Lim
Electron Devices, IEEE Transactions on , Volume: 48 Issue: 5 , May 2001
Page(s): 887 -896

[Abstract]   [PDF Full-Text]   JNL

3 A physically-based semi-empirical series resistance model for deep-submicron MOSFET I-V modeling
Lim, K.Y.; Zhou, X.
Electron Devices, IEEE Transactions on , Volume: 47 Issue: 6 , June 2000
Page(s): 1300 -1302

[Abstract]   [PDF Full-Text]   JNL


4 Exploring the novel characteristics of hetero-material gate field-effect transistors (HMGFETs) with gate-material engineering
Xing Zhou
Electron Devices, IEEE Transactions on , Volume: 47 Issue: 1 , Jan. 2000
Page(s): 113 -120

[Abstract]   [PDF Full-Text]   JNL


5 A general approach to compact threshold voltage formulation based on 2D numerical simulation and experimental correlation for deep-submicron ULSI technology development [CMOS]
Xing Zhou; Khee Yong Lim; Lim, D.
Electron Devices, IEEE Transactions on , Volume: 47 Issue: 1 , Jan. 2000
Page(s): 214 -221

[Abstract]   [PDF Full-Text]   JNL


6 A new "critical-current at linear-threshold" method for direct extraction of deep-submicron MOSFET effective channel length
Zhou, X.; Lim, K.Y.; Lim, D.
Electron Devices, IEEE Transactions on , Volume: 46 Issue: 7 , July 1999
Page(s): 1492 -1494

[Abstract]   [PDF Full-Text]   JNL


7 A simple and unambiguous definition of threshold voltage and its implications in deep-submicron MOS device modeling
Zhou, X.; Lim, K.Y.; Lim, D.
Electron Devices, IEEE Transactions on , Volume: 46 Issue: 4 , April 1999
Page(s): 807 -809

[Abstract]   [PDF Full-Text]   JNL


8  An experimentally-based DC model for the Bi-MOS structure and its adaptation to a circuit simulation environment
Rofail, S.S.; Yeo, K.S.; Chew, K.W.; Zhou, X.; Tang, T.W.
Electrical and Computer Engineering, 1998. IEEE Canadian Conference on , Volume: 1 , 1998
Page(s): 37 -40 vol.1

[Abstract]   [PDF Full-Text]   CNF


9  A predictive semi-analytical threshold voltage model for deep-submicron MOSFET's
Lim, K.Y.; Zhou, X.; Lim, D.; Zu, Y.; Ho, H.M.; Loiko, K.; Lau, C.K.; Tse, M.S.; Choo, S.C.
Electron Devices Meeting, 1998. Proceedings. 1998 IEEE Hong Kong , 1998
Page(s): 114 -117

[Abstract]   [PDF Full-Text]   CNF


10 Numerical investigation of subpicosecond electrical pulse generation by edge illumination of silicon transmission-line gaps
Xing Zhou; Tianwen Tang; Lee Seng Seah; Chong Jin Yap; Seok Cheow Choo
Quantum Electronics, IEEE Journal of , Volume: 34 Issue: 1 , Jan. 1998
Page(s): 171 -178

[Abstract]   [PDF Full-Text]   JNL


11 A novel hetero-material gate (HMG) MOSFET for deep-submicron ULSI technology
Xing Zhou; Wei Long
Electron Devices, IEEE Transactions on , Volume: 45 Issue: 12 , Dec. 1998
Page(s): 2546 -2548

[Abstract]   [PDF Full-Text]   JNL


12  A dynamic timing delay for accurate gate-level circuit simulation
Tang, T.; Zhou, X.
Circuits and Systems, 1996., IEEE 39th Midwest symposium on , Volume: 1 , 1996
Page(s): 325 -327 vol.1

[Abstract]   [PDF Full-Text]   CNF


13 Numerical physics of subpicosecond electrical pulse generation by nonuniform gap illumination
Xing Zhou
Quantum Electronics, IEEE Journal of , Volume: 32 Issue: 9 , Sept. 1996
Page(s): 1672 -1679

[Abstract]   [PDF Full-Text]   JNL


14 Regional Monte Carlo modeling of electron transport and transit-time estimation in graded-base HBT's
Xing Zhou
Electron Devices, IEEE Transactions on , Volume: 41 Issue: 4 , April 1994
Page(s): 484 -490

[Abstract]   [PDF Full-Text]   JNL


Home | Log-out | Journals | Conference Proceedings | Standards
Search by Author | Basic Search | Advanced Search | Join IEEE | Establish a Web Account

Copyright © 2001 IEEE — All rights reserved