A dynamic timing delay for accurate gate-level circuit simulation
Tang, T.; Zhou, X.
Editor(s): Cameron, G., Hassoun, M., Jerdee, A., Melvin, C.
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore



This Paper Appears in :
Circuits and Systems, 1996., IEEE 39th Midwest symposium on 

on Pages: 325327 vol.1

This Conference was Held : 18-21 Aug. 1996
1996 Vol. 1 ISBN: 0-7803-3636-4
IEEE Catalog Number: 96CH35995
Total Pages: 3 vol. xxxv+1439
References Cited: 5
Accession Number: 5602455



Abstract:
A dynamic delay model, which includes the nonlinear loading effect, the effects of the input transition time and the multiple-input triggering, is proposed for the gate-level timing simulation. It is shown that the developed delay model gives near circuit-level accuracy with comparable speed to other common delay models.



Subject Terms:
circuit analysis computing; dynamic timing delay; gate-level circuit simulation; dynamic delay model; nonlinear loading effect; input transition time; multiple-input triggering; gate-level timing simulation

| IEL Online Home | Search | Advanced Search | What's New | Help | Logout |
| FAQ's | Support | Comments |

Copyright 1999 Institute of Electrical and Electronics Engineers. All rights reserved.