Regional Monte Carlo modeling of electron transport and transit-time estimation in graded-base HBT's
Xing Zhou
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore



This Paper Appears in :
Electron Devices, IEEE Transactions on

on Pages: 484490
 
April 1994 Vol. 41 Issue: 4 ISSN: 0018-9383
References Cited: 41
CODEN: IETDAI
Accession Number: 4674453



Abstract:
Steady-state electron transport in graded-base heterojunction bipolar transistors is investigated using a regional ensemble Monte Carlo approach. Besides the graded band and scattering parameters already incorporated in the particle model, emitter-base and collector-base junctions are also considered in the boundary conditions for carrier injection/absorption. It is shown that optimum base transit times are directly related to the maximum average velocities, which occur at different base width-composition combinations. It also illustrates a general approach to studying electron transport in graded-band devices.<>


Subject Terms:
heterojunction bipolar transistors; semiconductor device models; S-parameters; Monte Carlo methods; boundary-value problems; carrier lifetime; carrier mobility; regional ensemble Monte Carlo approach; Monte Carlo modeling; electron transport; transit-time estimation; graded-base HBT; heterojunction bipolar transistors; graded band parameters; scattering parameters; particle model; emitter-base junctions; collector-base junctions; boundary conditions; carrier injection; carrier absorption; maximum average velocities; graded-band devices

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