史小蒙 

博士

电子线路与系统系,电子工程学院

  南洋理工大学

新加坡

 

 

 

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学历背景

  • 博士   南洋理工大学,新加坡 2003年8 ~ 2007年6月
  • 学士   北京大学,北京,中国 1999年9 ~ 2003年6  

工作经历

  • Teaching Fellow    南洋理工大学,新加坡, 2008年6月 ~ 今
  • Research Fellow    南洋理工大学,新加坡, 2007年7月 ~ 2008年5月
  • Project Officer    南洋理工大学,新加坡, 2006年8 ~ 2007年6月

研究方向

  • 器件建模
  • 集成电路封装
  • VLSI可测试性分析

教学经历

  • EE4340 超大规模集成电路系统
  • NM6014 超大规模集成电路可测试性分析

论文发表

  国际期刊

  • X. Shi, K. S. Yeo, J.-G. Ma, M. A. Do and E. Li, "Impact of Interconnect Effects on Broadband Transimpedance Amplifiers,''  Microwave Opt. Technol. Lett.,vol. 50, no. 12, pp. 3017-3020, Dec. 2008. [下载]

  • X. Shi, K. S. Yeo, J.-G. Ma, M. A. Do and E. Li, "Complex Shaped On-Wafer Interconnects Modeling for CMOS RFICs,''  IEEE Trans. VLSI Syst., vol. 16, no. 7, pp. 922-926, Jul. 2008.[下载]

  •  X. Shi, K. S. Yeo, M.A. Do, C. C. Boon, "Characterization and modeling of on-wafer single and multiple vias for CMOS RFICs," Microwave Opt. Technol. Lett. vlo. 50, no. 3, pp. 713-715, Mar. 2008. [下载]

  • X. Shi, K. S. Yeo, J.-G. Ma, and M. A. Do, "Distortion of pulsed signals in carbon nanotube interconnects,''  Microelectronics Journal (Elsevier), vol. 38, no. 3, pp. 365-370, Mar., 2007. [下载]

  • X. Shi, K. S. Yeo, J.-G. Ma, M. A. Do and E. Li, "Scalable model of on-wafer interconnects for high-speed CMOS ICs,''  IEEE Trans. Adv. Packag., vol. 29, no. 4, pp. 770-776, Nov., 2006. [下载]

  • X. Shi, K. S. Yeo, J.-G. Ma, M. A. Do and E. Li, "Sensitivity analysis of coupled interconnects for RFIC applications,'' IEEE Trans. Electromagn. Compat., vol. 48, no. 4, pp. 607-613, Nov., 2006. [下载]

  • X. Shi, J.-G. Ma, K. S. Yeo, M. A. Do and E. Li, "Equivalent circuit model of on-wafer CMOS interconnects for RFICs," IEEE Trans. VLSI Syst., vol. 13, no. 9, pp. 1060-1071, Sept., 2005. [下载]

  • X. Shi, J.-G. Ma, B. H. Ong, K. S. Yeo, M. A. Do and E. Li, "Equivalent circuit model of interconnect bends based on S-parameter measurements,'' Microwave Opt. Technol. Lett., vol. 45, no. 2, pp.170-173, Apr., 2005. [下载]

   国际会议

  • X. Shi, K. S. Yeo, M. A. Do and C. C. Boon, "Modeling of On-Wafer Interconnect System for CMOS RFICs '', Proc. Of IEEE EDSSC (IEEE International Conference on Electron Devices and Solid-State Circuits 2007), pp. 737-740, Tainan, Taiwan, Dec. 2007.

  • X. Shi, K. S. Yeo, M. A. Do and C. C. Boon, "Characterization of On-Wafer Vias for CMOS RFICs'', Proc. of ISIC  (International Symposium on Integrated Circuits 2007), pp. 216-219, Singapore, Sep. 2007.

  • X. Shi, Z. Lu, J.-G. Ma, E. Li, K. S. Yeo and M. A. Do, "Investigation of Interconnect Effects in A Transimpedance Amplifier'', Proc. of EMC-Zurich (International Zurich Symposium on EMC in Singapore 2006), pp. 586-589, Singapore, Mar., 2006.

  • X. Shi, J.-G. Ma, E. Li, K. S. Yeo and M. A. Do, "Sensitivity of On-Wafer Interconnects to CMOS Process Parameters at Radio Frequency'', Proc. of EMC-Zurich (International Zurich Symposium on EMC in Singapore 2006), pp. 590-594, Mar., Singapore, 2006.

  • X. Shi, J.-G. Ma, B. H. Ong, K. S. Yeo, M. A. Do and E. Li, "Equivalent circuit model of on-wafer interconnects for CMOS RFICs'',  Proc. of IEEE RAWCON (IEEE Radio and Wireless Conference 2004), pp. 95-98, Atlanta, GA, U.S.A., Sept., 2004.

 

 

All copyrights reserved by Shi Xiaomeng @ 2007